E komo mai! Welcome to the Advanced Electron Microscopy Center!
FIB-deposited platinum pad, 30 microns wide, with our School logo ion-milled into the surface.
Credit: Hope Ishii.
The Advanced Electron Microscopy Center (AEMC) is a service facility that provides sample preparation and electron and ion microscopy imaging and analysis to the University of Hawai‘i research community as well as other research institutions and industrial clients. The Center is housed in the School of Ocean and Earth Science and Technology (SOEST) and receives support from the Office of the Vice Chancellor for Research (OVCR), the Office of the Vice President for Research and Innovation (OVCRI), and the Hawai‘i Institute of Geophysics and Planetology (HIGP).
We can help you solve your research problems by nano-scale exploration! What can we do for you?
For general contact information, including our mailing address, please visit our Contact Us page.
Grain relative orientation deviation map of a quartz mylonite, highlighting extensive intragranular
deformation within large, unrecrystallised grains.
Credit: www.ebsd.com
A new Electron Backscatter Diffraction (EBSD) detector will be installed this summer on the FEI Helios NanoLab 660 Extreme High-Resolution Dual Beam FIB.
The EBSD is a scanning electron microscope (SEM) based technique that gives crystallographic information about the microstructure of a sample. In EBSD, a stationary electron beam interacts with a tilted crystalline sample and the diffracted electrons form a pattern that can be detected with a fluorescent screen. The diffraction pattern is characteristic of the crystal structure and orientation in the sample region where it was generated. Hence the
diffraction pattern can be used to determine the crystal orientation, discriminate between crystallographically different phases, characterize grain boundaries, and provide information about the local crystalline perfection.
Credit: nano.oxinst.com/products/ebsd/
See previous AEMC highlights in the Highlights Archive.