SOEST Electron Microprobe Facility
JEOL Hyperprobe JXA-8500F
POST Building Room 621
The new electron microprobe at the School of Ocean and Earth Sciences and Technology is a state-of-the-art instrument.
What it can do:
- Acquire major, minor and trace (50-300 ppm, matrix-dependent) element concentrations in minerals, glasses and other solid materials.
- High-resolution imaging using secondary-electron, backscattered-electron, cathodoluminescence and WDS X-ray signals.
- High spatial resolution achieved through a Schottky-type field-emission gun, resulting in a highly focused (30-50 nm) electron beam on the sample surface.
- Quantitative analysis of features well below 1 micron under low-kV conditions.
- For routine quantitative analyses under conventional conditions, the beam diameter can be defocused to a few microns to reduce damage of the sample or the carbon coating.
The JEOL Hyperprobe replaces a Cameca SX-50 electron microprobe. Installation was completed in Fall 2008.
Features:
- Five WDS spectrometers with the following configuration:
Sp1 TAP PET LDE1 LDE2 (Gas flow)
Sp2 PETH LIFH (Xe)
Sp3 TAP PET (Gas flow)
Sp4 PET LIF (Xe)
Sp5 TAPH PETH (Gas flow)
- Quantitative analysis from B to U
- High-precision stage with optical encoders (reproducibility <0.2 microns)
- Thermo-Noran System Six EDS with 128eV SDD detector (liquid N2-free)
- Gatan Mini-CL cathodoluminescence detector
- Probe for Windows software
- Sample holders rectangular thin sections and 1-inch rounds.
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(a) BSE image of a chromite-hosted multiphase melt inclusion from an ocean floor dunite. (b) Simultaneously acquired Al and (c) Mg distribution of this crystallized melt inclusion. Low abundance in black-blue, high abundance in orange-red. Field of view is 30 microns. |
More information available on request.
Contact:
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(808) 956-6193 |
ericwgh“a”hawaii.edu |
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(808) 956-6641 |
mogarcia”a”hawaii.edu |
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Probelab |
(808) 956-9406 |
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EH 12/2008